ARM ARM7TDMI Bedienungsanleitung Seite 135

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Debugging Your System
ARM DDI 0234B Copyright © 2001 ARM Limited. All rights reserved. 5-31
5.14 Test data registers
The six test data registers that can connect between DBGTDI and DBGTDO are
described in the following sections:
Bypass register
ARM7TDMI-S device identification (ID) code register
Instruction register on page 5-32
Scan path select register on page 5-32
Scan chain 1 on page 5-34
Scan chain 2 on page 5-34.
In the following descriptions, data is shifted during every CLK cycle when
DBGTCKEN enable is HIGH.
5.14.1 Bypass register
Purpose Bypasses the device during scan testing by providing a path
between DBGTDI and DBGTDO.
Length 1 bit.
Operating mode When the BYPASS instruction is the current instruction in the
instruction register, serial data is transferred from DBGTDI to
DBGTDO in the SHIFT-DR state with a delay of one CLK cycle
enabled by DBGTCKEN. There is no parallel output from the
bypass register. A logic 0 is loaded from the parallel input of the
bypass register in the CAPTURE-DR state.
5.14.2 ARM7TDMI-S device identification (ID) code register
Purpose Reads the 32-bit device identification code. No programmable
supplementary identification code is provided.
Length 32 bits. The format of the ID code register is as shown in
Figure 5-9.
Figure 5-9 ID code register format
011112272831
Version
Part number
Manufacturer identity 1
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